TransmissionElectronMicroscope - TEM
The transmission electron microscope (TEM) is a fundamental instrument for studies of matter and can provide information on structures and chemical compositions down to the nanoscale. Located in the Schwiete CosmoLab at Goethe University, the Thermo Scientific Talos F200X G2 S/TEM is ideal for analyses of geologic samples. It can achieve resolutions of 0.12 nm in TEM mode, 0.16 nm in STEM mode, 0.3 nm for EDS, and 0.8 eV for EELS.
Specifications:
- Accelerating voltages: 80–200 kV
- X-FEG electron source
- Thermo Scientific Ceta-S 4k × 4k 16M camera
- Super X-G2 EDS system (four windowless silicon drift detectors)
- Gatan post-column PEELS Continuum S/1077 EELS system
- Segmented Panter STEM detector system
Techniques:
- Bright field S/TEM
- Annular dark field STEM
- High resolution S/TEM imaging
- Electron diffraction
- EDS spectrum acquisition and imaging
- EELS spectrum acquisition and imaging
- S/TEM and EDS tomographic analyses
Contacts:
Dr. Sheryl A. Singerling
TEM Lab Manager
Tel.: +49 172 8385877
E-Mail: singerling@em.uni-frankfurt.de
Prof. Dr. Frank E. Brenker
Tel.: +49-(0)69-798-40134
E-Mail: f.brenker@em.uni-frankfurt.de